Appendix F: Weibull++ Accelerated Life Testing Module Examples

Reference Examples

• Weibull++ Accelerated Life Testing Module Reference Examples (demonstrate how Weibull++ Accelerated Life Testing module solves a variety of problems from published references)

Examples

Single-Stress QALT Analysis

• Examples by Model

  • Arrhenius Model Example

  • Eyring Model Example

  • Inverse Power Law Model Example

• Weibull++ Accelerated Life Testing Module Standard Folio Plot Types

• Analyzing Data from Accelerated Demonstration Test

• IPL-Weibull Analysis with Confidence Bounds on Plot

• Examining the Parameters and Life vs. Stress Plot from an Arrhenius-Weibull Analysis

• Electronic Components Example

• Circuit Boards Example

• Interval Data for Electronic Components

• Paper Clip Example

• Stability/Shelf Life Study

• Tensile Components Example

Multi-Stress QALT Analysis

• Examples by Model

  • Generalized Eyring Model Example

  • Temperature-Humidity Model Example

  • Temperature-NonThermal Model Example

  • General Log-Linear Model Example

  • Proportional Hazards Model Example

• Two-Stress Example for Electronic Devices

• Using Indicator Variables

QALT with Stress Profiles

• Automotive Part Test

• Multiple Time-Dependent Stresses

• Voltage Step-Stress Example

Related Analyses

• Likelihood Ratio Test Example

• Accelerated Degradation Analysis

• Accelerated Life Test Plans - Single Stress Type

• Accelerated Life Test Plans: Two Stress Types

• Using Weibull++ Accelerated Life Testing Module SimuMatic for Test Design